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attoAFM/MFM I+
attoAFM/MFM I+
low temperature atomic force microscope, cantilever based
The attoAFM I+ is a compact atomic force microscope designed particularly
for applications at low temperatures. The instrument works by scanning
the sample below a fixed cantilever and by measuring its deflection with
highest precision using a fiber based optical interferometer. Both contact
and non-contact modes are applicable. Furthermore, this system is suited for
magnetic force microscopy (MFM), electric force microscopy (EFM), and other
scanning force imaging modes. The extreme stability of the measurement
head combined with the ultra-low vibration attoDRY cryostats enables high
resolution magnetic imaging of nanostructures at low temperatures without
the need for liquid helium.
The microscope uses a set of xyz-positioners for coarse positioning of the
sample over 5 mm3. In addition, it features an interferometric encoder for
closed loop operation with 1 nm resolution, and an ultra large range
scanner with 125 µm scan range at 4 K. The attoAFM I+ head enables a
care-free tip exchange in less than 2 minutes, and the quick exchange sample holder features 8 electrical contacts for additional voltage or current
signals on the sample.
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01 vacuum window
02 LT and HV compatible feedthroughs
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03 microscope insert including single mode fiber
04 superconducting magnet (optional)
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05 attoDRY1100 cryostat (optional)
06 attoFPSensor based closed loop sensors
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07 attoAFM I+ head incl. alignment-free cantilever holder
08 quick exchange sample holder with 8 electrical contacts
09 ultra-large range xyz scanner 125 μm x 125 μm x 15 μm @ 4 K
Schematic drawing of the low temperature attoAFM I+
and the attoDRY1100 cryostat (optional)
10 xyz coarse positioners 5 mm x 5 mm x 5 mm
11 ultra stable titanium housing