attoAFM I
PAGE 113
attoAFM I+ head
CUSTOMER FEEDBACK
• alignment-free cantilever holder
• tip exchange in less than 2 minutes
...for further details, see page 32
Dr. N. Andreeva
The attoAFM I is great for Piezo Response Force Microscopy of both large
crystals and thin films because the microscope integrates flawlessly with
external electronics and gives access to all the relevant signals. The system
maintained regular weekly cooling cycles for a 2 year stretch and still works
great!
Optional upgrade
(St. Petersburg State Polytechnical University, Russia)
• 125 μm scan range @ 4 K
• closed loop scanning @ 1 nm resolution
...for further details, see page 27
PRODUCT KEY FEATURES
• alignment-free cantilever holder
• ultra compact, highly rigid AFM head
• interferometric encoders for closed loop scanning (optional)
• highly sensitive interferometric deflection detection
BENEFITS
• tip exchange in less than 2 minutes
• fits into any 2“magnet bore
• highest measurement sensitivity
• ultra high resolution imaging & long-term measurements
Conductivity Mapping
APPLICATION EXAMPLES
• ultra high resolution topographic imaging
• measurement of magnetic, electrostatic, ferroelectric sample
properties
• elasticity measurements
• research on multiferroics, magnetic semiconductors, superconductors, ...
Piezo-Response Force
Microscopy
COMPATIBLE COOLING SYSTEMS
• attoLIQUID1000/2000/3000/5000
• attoDRY1000/1100/2100
The attoAFM I
Kelvin Probe
microscope module
Force Microscopy
attoMICROSCOPY
Sophisticated Tools for Science