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attoAFM I
attoAFM I
low temperature atomic force microscope, cantilever based
The attoAFM I is a compact atomic force microscope designed particularly for applications at low and ultra low temperatures. The instrument
works by scanning the sample below a fixed cantilever and by measuring its deflection with highest precision using a fiber based optical
interferometer. Both contact and non-contact mode are applicable.
Furthermore, this system is suited for magnetic force microscopy (MFM),
electric force microscopy (EFM), and other imaging modes.
The extreme stability of the measurement head allows also for combinations with cryogen free pulse-tube based cooling systems for applications where liquid helium is not available or desired. The attoAFM I
is available with an optional interferometric encoder for closed loop
operation.
The microscope uses a set of xyz-positioners for coarse positioning of
the sample over a range of several mm. Developed particularly for cryogenic applications, the piezo-based scanner provides a large scan range
of 50 µm x 50 µm at room temperature, and 30 µm x 30 µm at liquid helium temperature. The exceptional combination of materials allows absolutely stable high resolution imaging of surfaces. Possible applications
are the measurement of local sample properties such as topography,
magnetic forces, or elasticity of surface structures.
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01 LT and HV compatible feedthroughs
02 vacuum window
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03 microscope insert including single mode fiber
04 superconducting magnet (optional)
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05 attoDRY1100 cryostat (optional)
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06 quick exchange sample holder
07 xyz scanner
08 xyz coarse positioners
09 ultra stable Titanium housing
Schematic drawing of the low temperature attoAFM I
and the attoDRY1100 cryostat (optional)
10 single mode fiber for interferometric deflection detection
11 alignment free cantilever holder