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Kelvin Probe Force Microscopy (KPFM)
additional AFM mode upgrades
Kelvin Probe Force Microscopy (KPFM)
KPFM yields information about the local variations of the work
function of a material with respect to the AFM tip. More informa-
tion on the details of this mode can be found on page 80.
U CPD
Work Functio
Sample
Tip
U AC
Optical fiber
+ ++
++
Tip
V
Dither piezo
Sample U
AC
Sample
U AC U DC
The KPFM upgrade contains
• KPFM software upgrade
• 10 conductive AFM tips
• KPFM test sample
• KPFM factory test at room temperture and low temperature
• KPFM demonstration and training during the installation
KPFM image of
Au-on-Pt pattern
Article Art.No.
KPFM upgrade 1009977