attoDRY1100
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attoDRY1100
touchscreen control of field & temperature
The attoDRY1100 offers a truly unique low temperature measurement
platform with a fully automated gas handling system. The integrated
touchscreen allows for conveniently setting the desired field (B) and
temperature (T) without even using a PC. More elaborate measurement
schemes such as programmable sweeps of B and T are easily possible via
a USB connection and a LabVIEW interface.
The toploading design enables quick and easy sample exchange, while
offering a generous sample space of 49.7 mm in diameter. The unmatched cooling performance via exchange gas coupling enables probe
cooldown times as short as 1-2 hours. The initial cooldown time of the
complete system is around 10-15 hours including a 9 T magnet.
The temperature stability was measured to be better than ±5 mK over 14
hours at 4 K.
Last but not least, the attoDRY1100 was specifically designed to provide
an ultra-low vibration measurement platform for cryogenic scanning
probe experiments without the need for liquid helium. Due to a proprietary design, mechanical vibrations created by the pulse-tube coldhead
are decoupled from the measurement platform. When measured with
the attoAFM I, vibration amplitudes of less than 0.15 nm RMS are routinely achieved (bandwidth of 200 Hz, vertical direction)*.
*Further reading: F.P. Quacquarelli et al., arXiv:1404.2046v1
PRODUCT KEY FEATURES
• scanning probe microscopy experiments in
a cryogen-free, low vibration environment
• fast exchange of samples and/or scanning probe tips
• measurements at a broad range of temperature and
magnetic field (optional) with highest stability
• integrated 4.3“ touchscreen
• USB/Ethernet interface, LabVIEW control
BENEFITS
• no liquid helium required
• full automation of field and temperature control
• designed for vibration sensitive measurements
• remote control, programmable sweeps
APPLICATION EXAMPLES
• solid state physics and quantum dot optics
• material science research on ceramics, polymers,
additives, alloys, ..
• semiconductor device characterization
COMPATIBLE MICROSCOPE SYSTEMS
• attoAFM I, attoMFM I, attoSHPM, attoAFM III, attoCFM I,
attoCFM II, attoCFM III, attoRAMAN
• attoAFM/CFM (on request)