Cutting-edge
Systems
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Nanotools for Scanning Electron Microscopes
sophisticated multi-degree-of-freedom solutions for SEM
attoAFM I for SEM
With a decade of experience in scanning probe microscopy, attocube
has succeeded in equipping the attoAFM I with all the virtues important for
successful operation inside a scanning electron microscope (SEM). Thanks to
its extremely rugged design and miniaturized size, the force microscope can
be fully integrated into almost any SEM currently available on the market.
Its 45° tilted design allows full visual access to both AFM tip and sample
using the SEM. Being compatible with virtually all commercially available
cantilevers, the attoAFM I allows the user not only to image surface topographies, but also to visualize e.g. surface magnetic or electrostatic properties.
Furthermore, by varying the stiffness of the cantilever, nanoindentation and
tensile strength experiments can be easily conducted.
attoAFM III for SEM
Similar to the attoAFM I, the attoAFM III is an offshoot of attocube‘s
successful low temperature atomic force microscope series. In contrast
to its cantilever-based counterpart, the attoAFM III use ́