attoAFM III
PAGE 125
CUSTOMER FEEDBACK
Optional upgrade
Dr. Stefan Heun
• closed loop scanning @ 1 nm resolution
...for further details, see page 27
Directly after the set up in our labs, the attoAFM III in a 3He cryostat - used
for scanning gate microscopy experiments - has started to produce great data
for us. It runs more than 5 years now, and we have published several papers
since then. The instrument worked within specifications from the first day and
we really appreciate the excellent attocube support throughout the years.
(Istituto Nanoscienze-CNR and Scuola Normale Superiore, Pisa, Italy)
PRODUCT KEY FEATURES
• ultra compact AFM head with unprecedented stability
• interferometric encoders for closed loop scanning (optional)
• highly sensitive, non-optical tuning fork sensor
• large cryogenic scan range:
30 µm x 30 µm x 2 µm @ 4 K
Scanning Gate
Microscopy
BENEFITS
• ultra high resolution imaging in non-contact mode
• high Q factor for high sensitivity measurements
• optimized S/N ratio due to LT compatible preamplifier
• no optical alignment necessary
APPLICATION EXAMPLES
• materials science: ultra-high resolution topographic imaging
• scanning gate microscopy at mK temperatures
• investigations of semiconductor structures
High resolution AFM
COMPATIBLE COOLING SYSTEMS
• attoLIQUID1000/2000/3000/5000
• attoDRY 1000/11000/2100
Kelvin Probe
Force Microscopy
The attoAFM III
microscope module
attoMICROSCOPY
Sophisticated Tools for Science